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|Title: ||Fine structure in spatial self-phase modulation patterns: at a glance determination of the sign of optical nonlinearity in highly nonlinear films|
|Authors: ||Lucchetti, L.|
Suchand Sandeep, C.S.
|Issue Date: ||Mar-2009 |
|Publisher: ||IOP Publishing Ltd.|
|Citation: ||Journal of Optics A: Pure and Applied Optics, 2009, Vol. 11(3), p034002|
|Abstract: ||We present a fast and simple method to determine the sign of the nonlinear coefficient n2 in films with high nonlinearity. The method exploits the effect of spatial self-phase modulation and the role of wavefront curvature that leads to a specific far field pattern that is dependent on the sign of n2 and on the sample position. The method can be considered a 'visualization' of the Z-scan for highly nonlinear films. Application to nematic liquid crystals under different experimental conditions confirms the results expected from the theory.|
|Description: ||Restricted Access.|
|Alternative Location: ||http://dx.doi.org/10.1088/1464-4258/11/3/034002|
|Copyright: ||2009 IOP Publishing Ltd.|
|Appears in Collections:||Research Papers (LAMP)|
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