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Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/3781

Title: Fine structure in spatial self-phase modulation patterns: at a glance determination of the sign of optical nonlinearity in highly nonlinear films
Authors: Lucchetti, L.
Suchand Sandeep, C.S.
Simoni, F.
Issue Date: Mar-2009
Publisher: IOP Publishing Ltd.
Citation: Journal of Optics A: Pure and Applied Optics, 2009, Vol. 11(3), p034002
Abstract: We present a fast and simple method to determine the sign of the nonlinear coefficient n2 in films with high nonlinearity. The method exploits the effect of spatial self-phase modulation and the role of wavefront curvature that leads to a specific far field pattern that is dependent on the sign of n2 and on the sample position. The method can be considered a 'visualization' of the Z-scan for highly nonlinear films. Application to nematic liquid crystals under different experimental conditions confirms the results expected from the theory.
Description: Restricted Access.
URI: http://hdl.handle.net/2289/3781
ISSN: 1464-4258
1741-3567 (Online)
Alternative Location: http://dx.doi.org/10.1088/1464-4258/11/3/034002
Copyright: 2009 IOP Publishing Ltd.
Appears in Collections:Research Papers (LAMP)

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