Fine structure in spatial self-phase modulation patterns: at a glance determination of the sign of optical nonlinearity in highly nonlinear films

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/3781

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DC Field	Value	Language
dc.contributor.author	Lucchetti, L.	-
dc.contributor.author	Suchand Sandeep, C.S.	-
dc.contributor.author	Simoni, F.	-
dc.date.accessioned	2009-06-17T06:48:32Z	-
dc.date.available	2009-06-17T06:48:32Z	-
dc.date.issued	2009-03	-
dc.identifier.citation	Journal of Optics A: Pure and Applied Optics, 2009, Vol. 11(3), p034002	en
dc.identifier.issn	1464-4258	-
dc.identifier.issn	1741-3567 (Online)	-
dc.identifier.uri	http://hdl.handle.net/2289/3781	-
dc.description	Restricted Access.	en
dc.description.abstract	We present a fast and simple method to determine the sign of the nonlinear coefficient n2 in films with high nonlinearity. The method exploits the effect of spatial self-phase modulation and the role of wavefront curvature that leads to a specific far field pattern that is dependent on the sign of n2 and on the sample position. The method can be considered a 'visualization' of the Z-scan for highly nonlinear films. Application to nematic liquid crystals under different experimental conditions confirms the results expected from the theory.	en
dc.language.iso	en	en
dc.publisher	IOP Publishing Ltd.	en
dc.relation.uri	http://dx.doi.org/10.1088/1464-4258/11/3/034002	en
dc.rights	2009 IOP Publishing Ltd.	en
dc.title	Fine structure in spatial self-phase modulation patterns: at a glance determination of the sign of optical nonlinearity in highly nonlinear films	en
dc.type	Article	en
Appears in Collections:	Research Papers (LAMP)

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