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dc.contributor.authorLucchetti, L.-
dc.contributor.authorSuchand Sandeep, C.S.-
dc.contributor.authorSimoni, F.-
dc.identifier.citationJournal of Optics A: Pure and Applied Optics, 2009, Vol. 11(3), p034002en
dc.identifier.issn1741-3567 (Online)-
dc.descriptionRestricted Access.en
dc.description.abstractWe present a fast and simple method to determine the sign of the nonlinear coefficient n2 in films with high nonlinearity. The method exploits the effect of spatial self-phase modulation and the role of wavefront curvature that leads to a specific far field pattern that is dependent on the sign of n2 and on the sample position. The method can be considered a 'visualization' of the Z-scan for highly nonlinear films. Application to nematic liquid crystals under different experimental conditions confirms the results expected from the theory.en
dc.publisherIOP Publishing Ltd.en
dc.rights2009 IOP Publishing Ltd.en
dc.titleFine structure in spatial self-phase modulation patterns: at a glance determination of the sign of optical nonlinearity in highly nonlinear filmsen
Appears in Collections:Research Papers (LAMP)

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