Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/2721
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dc.contributor.authorJohnson, M.-
dc.contributor.authorSrinivasan, G.-
dc.date.accessioned2007-06-11T09:43:19Z-
dc.date.available2007-06-11T09:43:19Z-
dc.date.issued1978-
dc.identifier.citationPhysica Scripta, 1978, Vol.18, p476-480en
dc.identifier.issn0031-8949-
dc.identifier.issn1402-4896 (Online)-
dc.identifier.urihttp://hdl.handle.net/2289/2721-
dc.descriptionRestricted Access.en
dc.description.abstractWe propose that the electrons in the localized regime (close to the threshold for metallic conduction) form a highly correlated electron liquid and discuss the a.c.-conductivity of such a liquid. In particular we discuss the d.c.-limit in a Wigner lattice phase. We find that defect migration contributes a term of the form σ = σi exp (-W/kBT) where σi is density dependent in qualitative agreement with experiments on devices with little disorder.en
dc.format.extent312927 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherIOP Publishing Ltd.en
dc.relation.urihttp://dx.doi.org/10.1088/0031-8949/18/6/026en
dc.rights1978 IOP Publishing Ltd.en
dc.titleThe MOSFET Inversion Layer: The Conductivity of a Localized, Highly Correlated Phaseen
dc.typeArticleen
Appears in Collections:Research Papers (TP)

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