Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/7195
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dc.contributor.authorMadhukar, S-
dc.contributor.authorRaghunathan, V.A.-
dc.date.accessioned2019-04-30T21:10:06Z-
dc.date.available2019-04-30T21:10:06Z-
dc.date.issued2019-04-
dc.identifier.citationJournal of Applied Crystallography, 2019, Vol. 52, p 440-444en_US
dc.identifier.issn1600-5767-
dc.identifier.urihttp://hdl.handle.net/2289/7195-
dc.descriptionRestricted Access.en_US
dc.description.abstractAn electron density model for small-angle X-ray scattering from a novel thickness-modulated phase of lipid membranes is presented, and analytical expressions are derived for the intensities of the diffraction peaks. Structural parameters of the membranes in this phase have been determined from a least-squares fit of the calculated intensities to the observed ones. The amplitude of the thickness modulation is found to be about an order of magnitude smaller than the membrane thickness, which accounts for the very small number and very weak intensities of the peaks arising from these modulations.en_US
dc.language.isoenen_US
dc.publisherJohn Wiley & Sonsen_US
dc.relation.urihttps://doi.org/10.1107/S1600576719002978en_US
dc.rights2019, International Union of Crystallographyen_US
dc.subjectlipid membranesen_US
dc.subjectsmall-angle X-ray scatteringen_US
dc.subjectelectron density modelsen_US
dc.titleX-ray scattering from a thickness-modulated phase of lipid membranesen_US
dc.typeArticleen_US
Appears in Collections:Research Papers (SCM)

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