Please use this identifier to cite or link to this item:
http://hdl.handle.net/2289/5922
Title: | Cryo-TEM studies of two smectic phases of an asymmetric bent-core material. Invited Article |
Authors: | Zhang, C. Sadashiva, B.K. Lavrentovich, O.D. Jakli, A. |
Keywords: | electron microscopy defects nanostructure |
Issue Date: | Dec-2013 |
Publisher: | Taylor & Francis |
Citation: | Liquid Crystals, 2013 , Vol. 40, p 1636-1645 |
Abstract: | Cryo-TEM studies on two smectic phases of an asymmetric bent-core liquid crystal material are presented and compared to prior X-ray results obtained in bulk samples. While the bulk samples have layer-modulated structures, those modulations are not observable in the 100-nm-thick TEM samples, indicating surface-induced suppression of the layer modulations. The observed layer spacing is in agreement with the X-ray results in the lower temperature smectic phase, but distinctly larger in the higher temperature phase. This indicates surface-induced suppression of the director tilt. Cryo-TEM textures resolve the profiles of individual smectic layers at the scales down to few nanometres and reveal the presence of edge and screw dislocations, twist grain boundaries, small-angle and large-angle tilt grain boundaries. |
Description: | Restricted Access. Invited article |
URI: | http://hdl.handle.net/2289/5922 |
ISSN: | 0267-8292 1366-5855 (online) |
Alternative Location: | http://dx.doi.org/10.1080/02678292.2013.812251 |
Copyright: | 2013 Taylor & Francis |
Appears in Collections: | Research Papers (SCM) |
Files in This Item:
File | Description | Size | Format | |
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2013_LC_40_1636.pdf Restricted Access | Restricted Access | 727.1 kB | Adobe PDF | View/Open Request a copy |
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