Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/5922
Title: Cryo-TEM studies of two smectic phases of an asymmetric bent-core material. Invited Article
Authors: Zhang, C.
Sadashiva, B.K.
Lavrentovich, O.D.
Jakli, A.
Keywords: electron microscopy
defects nanostructure
Issue Date: Dec-2013
Publisher: Taylor & Francis
Citation: Liquid Crystals, 2013 , Vol. 40, p 1636-1645
Abstract: Cryo-TEM studies on two smectic phases of an asymmetric bent-core liquid crystal material are presented and compared to prior X-ray results obtained in bulk samples. While the bulk samples have layer-modulated structures, those modulations are not observable in the 100-nm-thick TEM samples, indicating surface-induced suppression of the layer modulations. The observed layer spacing is in agreement with the X-ray results in the lower temperature smectic phase, but distinctly larger in the higher temperature phase. This indicates surface-induced suppression of the director tilt. Cryo-TEM textures resolve the profiles of individual smectic layers at the scales down to few nanometres and reveal the presence of edge and screw dislocations, twist grain boundaries, small-angle and large-angle tilt grain boundaries.
Description: Restricted Access. Invited article
URI: http://hdl.handle.net/2289/5922
ISSN: 0267-8292
1366-5855 (online)
Alternative Location: http://dx.doi.org/10.1080/02678292.2013.812251
Copyright: 2013 Taylor & Francis
Appears in Collections:Research Papers (SCM)

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