Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/4496
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dc.contributor.authorAridersson, S.-
dc.contributor.authorLundqvist, B.I.-
dc.contributor.authorSrinivasan, G.-
dc.contributor.authorWikborg, E.-
dc.date.accessioned2012-05-16T05:29:39Z-
dc.date.available2012-05-16T05:29:39Z-
dc.date.issued1972-08-15-
dc.identifier.citationSolid State Communications,1972, Vol.11, p.1405en
dc.identifier.issn0038-1098-
dc.identifier.urihttp://hdl.handle.net/2289/4496-
dc.descriptionRestricted Access. An open-access version is available at arXiv.org (one of the alternative locations)en
dc.language.isoenen
dc.publisherElsevieren
dc.rights1972, Elsevieren
dc.titlePlasmon thresholds in the secondary electron yield — ii. Dispersion lawsen
dc.typeArticleen
Appears in Collections:Research Papers (A&A)

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