Please use this identifier to cite or link to this item:
http://hdl.handle.net/2289/4489
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Srinivasan, G. | - |
dc.contributor.author | Jonson, M. | - |
dc.date.accessioned | 2012-05-15T08:19:47Z | - |
dc.date.available | 2012-05-15T08:19:47Z | - |
dc.date.issued | 1975 | - |
dc.identifier.citation | Journal of Physics C: Solid State Physics, 1975, Vol 8, p.L37 | en |
dc.identifier.uri | http://hdl.handle.net/2289/4489 | - |
dc.description | Restricted Access. An open-access version is available at arXiv.org (one of the alternative locations) | en |
dc.language.iso | en | en |
dc.publisher | IOP Science | en |
dc.relation.uri | doi:10.1088/0022-3719/8/3/003 | en |
dc.rights | 1975, IOP Science Publishing | en |
dc.title | Dielectric screening in inversion layers | en |
dc.type | Article | en |
Appears in Collections: | Research Papers (A&A) |
Files in This Item:
File | Description | Size | Format | |
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1975_Cavendish laboratory Report_.pdf Restricted Access | Restricted Access | 1.09 MB | Adobe PDF | View/Open Request a copy |
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