Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/4160
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dc.contributor.authorKumar, Arun T.-
dc.contributor.authorSastry, V.S.S.-
dc.contributor.authorIshikawa, Ken-
dc.contributor.authorTakezoe, Hideo-
dc.contributor.authorMadhusudana, N.V.-
dc.contributor.authorDhara, Surajit-
dc.date.accessioned2011-09-21T11:13:12Z-
dc.date.available2011-09-21T11:13:12Z-
dc.date.issued2011-08-
dc.identifier.citationLiquid Crystals, 2011, Vol.38, p971en
dc.identifier.issn0267-8292-
dc.identifier.issn1366-5855 (online)-
dc.identifier.urihttp://hdl.handle.net/2289/4160-
dc.descriptionRestricted Access.en
dc.description.abstractWe report experimental studies on defects in a nematic liquid crystal with negative dielectric anisotropy mounted in a cell with perfluoropolymer-coated surfaces. The sample exhibits a discontinuous anchoring transition from planar to homeotropic on cooling at zero or a small electric field, and above a cross-over voltage a continuous ‘inverse Freedericksz transition’, at which the director starts tilting in opposite directions at the two surfaces. Defects of strength ±1/2 are either annihilated or expelled when the director tilts. On the other hand, disclination lines of ±1 which end in partial point defects (boojums) at the surfaces in the planar alignment regime acquire point defects of strength ±1 at the midplane of the cell when the director tilts. At a low enough temperature, the homeotropic anchoring becomes strong, and an electric field above the Freedericksz threshold generates the usual umbilic defects, which follow the dynamic scaling laws found in earlier studies.en
dc.language.isoenen
dc.publisherTaylor & Francisen
dc.relation.urihttp://dx.doi.org/10.1080/02678292.2011.587962en
dc.rights2011 Taylor & Francisen
dc.subjectDefectsen
dc.subjectSurface Anchoringen
dc.subjectAnnihilationen
dc.subjectBoojumsen
dc.titleEffect of an electric field on defects in a nematic liquid crystal with variable surface anchoringen
dc.typeArticleen
Appears in Collections:Research Papers (SCM)

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