Mechanical properties of Langmuir−Blodgett films of a discogen−DNA complex by atomic force microscopy

Nayak, Alpana; Suresh, K.A.

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DC Field	Value	Language
dc.contributor.author	Nayak, Alpana	-
dc.contributor.author	Suresh, K.A.	-
dc.date.accessioned	2009-06-17T06:32:13Z	-
dc.date.available	2009-06-17T06:32:13Z	-
dc.date.issued	2009-02-16	-
dc.identifier.citation	The Journal of Physical Chemistry B, 2009, Vol. 113(12), p3669-3675	en
dc.identifier.issn	1520-6106	-
dc.identifier.issn	1520-5207 (Online)	-
dc.identifier.uri	http://hdl.handle.net/2289/3774	-
dc.description	Restricted Access.	en
dc.description.abstract	We have studied the mechanical properties of films of a novel ionic discogen, pyridinium tethered with hexaalkoxytriphenylene (PyTp) and its complex with DNA (PyTp−DNA) using atomic force microscope (AFM). The PyTp and PyTp−DNA complex monolayer films were first formed at air−water interface and then transferred onto silicon substrates by Langmuir−Blodgett (LB) technique. For the mechanical properties, particularly to obtain elastic modulus, we have carried out nanoindentation measurements on the LB films of PyTp and also PyTp−DNA complex. The load versus indentation curves from the nanoindentation measurements were analyzed quantitatively using Hertz model. Our analysis yields Young’s modulus values of 54 and 160 MPa for the PyTp and PyTp−DNA complex films, respectively. In addition, the LB films were imaged in the tapping mode AFM to obtain topography and phase images simultaneously. The energy dissipation maps were constructed from the phase images to determine qualitatively the variation in stiffness on the film surfaces. We find that the complex film exhibits a nonuniform surface with varying stiffness while the pure film exhibits a uniform surface.	en
dc.language.iso	en	en
dc.publisher	American Chemical Society	en
dc.relation.uri	http://dx.doi.org/10.1021/jp806600g	en
dc.rights	2009 American Chemical Society	en
dc.title	Mechanical properties of Langmuir−Blodgett films of a discogen−DNA complex by atomic force microscopy	en
dc.type	Article	en
dc.additional	This article is part of the B: Pierre G. de Gennes Memorial special issue.	en
Appears in Collections:	Research Papers (SCM)

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