Modified pinhole spatial filter producing a clean flat-topped beam

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/3142

Full metadata record

DC Field	Value	Language
dc.contributor.author	Hariharan, P.	-
dc.contributor.author	Narayanan, Andal	-
dc.date.accessioned	2007-06-26T10:04:41Z	-
dc.date.available	2007-06-26T10:04:41Z	-
dc.date.issued	2004-03	-
dc.identifier.citation	Optics & Laser Technology, 2004, Vol.36, p151-153	en
dc.identifier.issn	0030-3992	-
dc.identifier.uri	http://hdl.handle.net/2289/3142	-
dc.description	Restricted Access.	en
dc.description.abstract	The expanded beam from a laser has a sharply peaked intensity profile. As a result, in many applications where uniform illumination of an extended field is required, it is only possible to use the central part of the beam. We show that if the pinhole normally used to spatially filter the beam is replaced by an annular phase mask, it should be possible to obtain a clean beam providing very nearly uniform illumination over an extended area, with a minimal loss of light.	en
dc.format.extent	180826 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	en
dc.publisher	Elsevier B.V.	en
dc.relation.uri	http://dx.doi.org/10.1016/j.optlastec.2003.07.006	en
dc.rights	2004 Elsevier B.V.	en
dc.subject	Laser beams	en
dc.subject	Beam expansion;	en
dc.subject	Uniform illumination	en
dc.title	Modified pinhole spatial filter producing a clean flat-topped beam	en
dc.type	Article	en
Appears in Collections:	Research Papers (LAMP)

Files in This Item:

File	Description	Size	Format
2004 OLT 36 p151.pdf Restricted Access	Restricted Access	176.59 kB	Adobe PDF	View/Open Request a copy