Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/2947
Full metadata record
DC FieldValueLanguage
dc.contributor.authorSuresh, K.A.-
dc.contributor.authorShi, Yushan-
dc.contributor.authorBhattacharyya, Amitabha.-
dc.contributor.authorKumar, Satyendra-
dc.date.accessioned2007-06-18T06:47:01Z-
dc.date.available2007-06-18T06:47:01Z-
dc.date.issued2001-04-10-
dc.identifier.citationModern Physics Letters B, 2001, Vol.15, p225-233en
dc.identifier.issn0217-9849-
dc.identifier.urihttp://hdl.handle.net/2289/2947-
dc.descriptionRestricted Access.en
dc.description.abstractHigh-resolution X-ray reflectivity has been employed to study the structure, wetting properties, and interfacial roughness of ultra-thin liquid crystal films. The films were prepared at the air–water interface and transferred on to glass substrates by a modified horizontal deposition technique. A 3-layer film was found to partially-wet the substrate in the nematic and isotropic phases and dewet upon cooling to the crystalline phase. The surface roughnesses at the air-film and the film-glass interfaces exhibited a gradual reversible but hysteretic conformal (strongly correlated) to non-conformal transition between the isotropic and smectic-A phases.en
dc.format.extent349470 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.publisherWorld Scientific Publishing Companyen
dc.relation.urihttp://dx.doi.org/10.1142/S0217984901001628en
dc.rights2001 World Scientific Publishing Companyen
dc.titleWetting-dewetting transition and conformal to non-conformal interfacial roughness transition in ultra-thin liquid crystal films on solid substratesen
dc.typeArticleen
Appears in Collections:Research Papers (SCM)

Files in This Item:
File Description SizeFormat 
2001.MPL-B.15.P225.pdf
  Restricted Access
Restricted Access341.28 kBAdobe PDFView/Open Request a copy


Items in RRI Digital Repository are protected by copyright, with all rights reserved, unless otherwise indicated.