Design of a compact scanning tunnelling microscope with a feedback to coarse approach controller for low scan ranges

Jayadevaiah, M.; Lakshminarayanan, V.

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/2936

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DC Field	Value	Language
dc.contributor.author	Jayadevaiah, M.	-
dc.contributor.author	Lakshminarayanan, V.	-
dc.date.accessioned	2007-06-18T05:01:08Z	-
dc.date.available	2007-06-18T05:01:08Z	-
dc.date.issued	2004-05	-
dc.identifier.citation	Measument Science and Technology, 2004, Vol.15, pN35-N38	en
dc.identifier.issn	0957-0233	-
dc.identifier.issn	1361-6501 (Online)	-
dc.identifier.uri	http://hdl.handle.net/2289/2936	-
dc.description	Restricted Access.	en
dc.description.abstract	We describe here the design of a simple and compact scanning tunnelling microscope based on the principle of an inertial slider mechanism. The Z feedback which adjusts the tip–sample gap separation is applied to the coarse movement piezo unlike the conventional method of applying it to the four quadrants of the tip scanning piezo. This method produces better stability in addition to eliminating the requirement of four high voltage amplifiers. Several simple features incorporated in the sample stage improve the stability and reliability considerably.	en
dc.format.extent	207782 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	en
dc.publisher	IOP Publishing Ltd.	en
dc.relation.uri	http://dx.doi.org/10.1088/0957-0233/15/5/N02	en
dc.rights	2004 IOP Publishing Ltd.	en
dc.subject	scanning tunnelling microscope	en
dc.subject	coarse approach feedback mode	en
dc.subject	high voltage amplifiers	en
dc.title	Design of a compact scanning tunnelling microscope with a feedback to coarse approach controller for low scan ranges	en
dc.type	Article	en
Appears in Collections:	Research Papers (SCM)

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