Measurement of polarization resistance and double-layer capacity by large amplitude exponential relaxation technique

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/1086

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DC Field	Value	Language
dc.contributor.author	Lakshminarayanan, V.	-
dc.contributor.author	Rajagopalan, S.R.	-
dc.date.accessioned	2006-01-04T10:55:23Z	-
dc.date.available	2006-01-04T10:55:23Z	-
dc.date.issued	1986-08-20	-
dc.identifier.citation	Current Science, 1986, Vol. 55, p778-780.	en
dc.identifier.issn	0011-3891	-
dc.identifier.uri	http://hdl.handle.net/2289/1086	-
dc.format.extent	153467 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	en
dc.publisher	Indian Academy of Sciences, Bangalore, India.	en
dc.rights	Indian Academy of Sciences, Bangalore, India.	en
dc.title	Measurement of polarization resistance and double-layer capacity by large amplitude exponential relaxation technique	en
dc.type	Article	en
Appears in Collections:	Research Papers (SCM)

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