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Gaps between avalanches in one-dimensional random-field Ising models

dc.contributor.authorNampoothiri, Jishnu N
dc.contributor.authorRamola, Kabir
dc.contributor.authorSabhapandit, Sanjib
dc.contributor.authorChakraborty, Bulbul
dc.date.accessioned2019-03-06T14:18:59Z
dc.date.available2019-03-06T14:18:59Z
dc.date.issued2017-09-06
dc.descriptionOpen Accessen_US
dc.description.abstractWe analyze the statistics of gaps (Δ H ) between successive avalanches in one-dimensional random-field Using models (RFIMs) in an external field H at zero temperature. In the first part of the paper we study the nearest-neighbor ferromagnetic RFIM. We map the sequence of avalanches in this system to a non homogeneous Poisson process with an H -dependent rate ρ (H ) . We use this to analytically compute the distribution of gaps P (Δ H ) between avalanches as the field is increased monotonically from -∞ to +∞ . We show that P (Δ H ) tends to a constant C (R ) as Δ H →0+ , which displays a nontrivial behavior with the strength of disorder R . We verify our predictions with numerical simulations. In the second part of the paper, motivated by avalanche gap distributions in driven disordered amorphous solids, we study a long-range antiferromagnetic RFIM. This model displays a gaped behavior P (Δ H )=0 up to a system size dependent offset value Δ Hoff , and P (Δ H ) ˜(ΔH -Δ Hoff) θ as Δ H →Hoff+ . We perform numerical simulations on this model and determine θ ≈0.95 (5 ) . We also discuss mechanisms which would lead to a nonzero exponent θ for general spin models with quenched random fields.en_US
dc.identifier.citationPhysical. Review. E, 2017, vol.96, p032107en_US
dc.identifier.issn2470-0045
dc.identifier.urihttp://hdl.handle.net/2289/7178
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.urihttps://arxiv.org/abs/1705.09069en_US
dc.relation.urihttps://doi.org/10.1103/PhysRevE.96.032107en_US
dc.rights©2017 American Physical Societyen_US
dc.titleGaps between avalanches in one-dimensional random-field Ising modelsen_US
dc.typeArticleen_US

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