Surface Metrology using One-element Interferometry
| dc.additional | Date of Conference : 16-24 May 2015, Gran Canaria, Spain | en_US |
| dc.contributor.author | Balasubramanyam, R | |
| dc.date.accessioned | 2021-02-19T08:53:48Z | |
| dc.date.available | 2021-02-19T08:53:48Z | |
| dc.date.issued | 2015 | |
| dc.description | Restricted Access. | en_US |
| dc.description.abstract | Surface metrology is the key to make and retain high quality surfaces. There are many coordinate measurement methods and machines to measure large 3D surfaces. Some methods are: triangulation, time-of-flight, structured-lighting, photogrammetry and radio-holography. They differ in ease-of-use, economy, complexity and accuracy. Some, e.g. photogrammetry, measure point-by-point while others, e.g. holography, measure a point-cloud at one go. Some are spot-measurements while others are areal averages. Both photogrammetry and radio-holography are used to measure the surfaces of astronomical telescopes. Both phase-referenced and phase-recovered holographic techniques are used. In this paper we present yet another method to measure surfaces of large astronomical telescopes. | en_US |
| dc.identifier.citation | URSI Asia-Pacific Radio Science Conference (AP-RASC), 2015, Gran Canaria, Spain | en_US |
| dc.identifier.isbn | Electronic ISBN:978-908-25987-5-9 | |
| dc.identifier.isbn | USB ISBN:978-908-25987-4-2 | |
| dc.identifier.uri | http://hdl.handle.net/2289/7687 | |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.relation.uri | https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7303182 | en_US |
| dc.rights | 2015, IEEE | en_US |
| dc.title | Surface Metrology using One-element Interferometry | en_US |
| dc.type | Article | en_US |

