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Measurement of polarization resistance and double-layer capacity by large amplitude exponential relaxation technique

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dc.contributor.authorLakshminarayanan, V.
dc.contributor.authorRajagopalan, S.R.
dc.date.accessioned2006-01-04T10:55:23Z
dc.date.available2006-01-04T10:55:23Z
dc.date.issued1986-08-20
dc.format.extent153467 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citationCurrent Science, 1986, Vol. 55, p778-780.en
dc.identifier.issn0011-3891
dc.identifier.urihttp://hdl.handle.net/2289/1086
dc.language.isoenen
dc.publisherIndian Academy of Sciences, Bangalore, India.en
dc.rightsIndian Academy of Sciences, Bangalore, India.en
dc.titleMeasurement of polarization resistance and double-layer capacity by large amplitude exponential relaxation techniqueen
dc.typeArticleen

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