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White light Z-scan measurements of ultrafast optical nonlinearity in reduced graphene oxide nanosheets in the 400–700 nm region

dc.contributor.authorPerumbilavil, Sreekanth
dc.contributor.authorSankar, Pranitha
dc.contributor.authorRose, Priya
dc.contributor.authorPhilip, Reji
dc.date.accessioned2015-12-02T05:53:08Z
dc.date.available2015-12-02T05:53:08Z
dc.date.issued2015-08-03
dc.descriptionOpen Accessen_US
dc.description.abstractWavelength dispersion of optical power limiting is an important factor to be considered while designing potential optical limiters for laser safety applications. We report the observation of broadband, ultrafast optical limiting in reduced graphene oxide (rGO), measured by a single open aperture Z-scan using a white light continuum (WLC) source. WLC Z-scan is fast when the nonlinearity is to be measured over broad wavelength ranges, and it obviates the need for an ultrafast tunable laser making it cost-economic compared to conventional Z-scan. The nonlinearity arises from nondegenerate two-photon absorption, owing mostly to the crystallinity and extended π conjugation of rGO.en_US
dc.identifier.citationApplied Physics Letters, 2015, Vol.107, p051104en_US
dc.identifier.issn0003-6951
dc.identifier.issn1077-3118(Online)
dc.identifier.urihttp://hdl.handle.net/2289/6355
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.urihttp://dx.doi.org/10.1063/1.4928124en_US
dc.rights2015 American Institute of Physics This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleWhite light Z-scan measurements of ultrafast optical nonlinearity in reduced graphene oxide nanosheets in the 400–700 nm regionen_US
dc.typeArticleen_US

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