White light Z-scan measurements of ultrafast optical nonlinearity in reduced graphene oxide nanosheets in the 400–700 nm region
| dc.contributor.author | Perumbilavil, Sreekanth | |
| dc.contributor.author | Sankar, Pranitha | |
| dc.contributor.author | Rose, Priya | |
| dc.contributor.author | Philip, Reji | |
| dc.date.accessioned | 2015-12-02T05:53:08Z | |
| dc.date.available | 2015-12-02T05:53:08Z | |
| dc.date.issued | 2015-08-03 | |
| dc.description | Open Access | en_US |
| dc.description.abstract | Wavelength dispersion of optical power limiting is an important factor to be considered while designing potential optical limiters for laser safety applications. We report the observation of broadband, ultrafast optical limiting in reduced graphene oxide (rGO), measured by a single open aperture Z-scan using a white light continuum (WLC) source. WLC Z-scan is fast when the nonlinearity is to be measured over broad wavelength ranges, and it obviates the need for an ultrafast tunable laser making it cost-economic compared to conventional Z-scan. The nonlinearity arises from nondegenerate two-photon absorption, owing mostly to the crystallinity and extended π conjugation of rGO. | en_US |
| dc.identifier.citation | Applied Physics Letters, 2015, Vol.107, p051104 | en_US |
| dc.identifier.issn | 0003-6951 | |
| dc.identifier.issn | 1077-3118(Online) | |
| dc.identifier.uri | http://hdl.handle.net/2289/6355 | |
| dc.language.iso | en | en_US |
| dc.publisher | American Institute of Physics | en_US |
| dc.relation.uri | http://dx.doi.org/10.1063/1.4928124 | en_US |
| dc.rights | 2015 American Institute of Physics This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. | en_US |
| dc.title | White light Z-scan measurements of ultrafast optical nonlinearity in reduced graphene oxide nanosheets in the 400–700 nm region | en_US |
| dc.type | Article | en_US |

