Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/5922
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dc.contributor.authorZhang, C.-
dc.contributor.authorSadashiva, B.K.-
dc.contributor.authorLavrentovich, O.D.-
dc.contributor.authorJakli, A.-
dc.date.accessioned2014-07-18T07:33:37Z-
dc.date.available2014-07-18T07:33:37Z-
dc.date.issued2013-12-
dc.identifier.citationLiquid Crystals, 2013 , Vol. 40, p 1636-1645en
dc.identifier.issn0267-8292-
dc.identifier.issn1366-5855 (online)-
dc.identifier.urihttp://hdl.handle.net/2289/5922-
dc.descriptionRestricted Access. Invited articleen
dc.description.abstractCryo-TEM studies on two smectic phases of an asymmetric bent-core liquid crystal material are presented and compared to prior X-ray results obtained in bulk samples. While the bulk samples have layer-modulated structures, those modulations are not observable in the 100-nm-thick TEM samples, indicating surface-induced suppression of the layer modulations. The observed layer spacing is in agreement with the X-ray results in the lower temperature smectic phase, but distinctly larger in the higher temperature phase. This indicates surface-induced suppression of the director tilt. Cryo-TEM textures resolve the profiles of individual smectic layers at the scales down to few nanometres and reveal the presence of edge and screw dislocations, twist grain boundaries, small-angle and large-angle tilt grain boundaries.en
dc.language.isoenen
dc.publisherTaylor & Francisen
dc.relation.urihttp://dx.doi.org/10.1080/02678292.2013.812251en
dc.rights2013 Taylor & Francisen
dc.subjectelectron microscopyen
dc.subjectdefects nanostructureen
dc.titleCryo-TEM studies of two smectic phases of an asymmetric bent-core material. Invited Articleen
dc.typeArticleen
Appears in Collections:Research Papers (SCM)

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