Some procedures in the determination of the absolute configuration of crystals

Vaidya, S.N.; Ramaseshan, S.

Please use this identifier to cite or link to this item: http://hdl.handle.net/2289/4985

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DC Field	Value	Language
dc.contributor.author	Vaidya, S.N.	-
dc.contributor.author	Ramaseshan, S.	-
dc.date.accessioned	2012-07-19T08:11:03Z	-
dc.date.available	2012-07-19T08:11:03Z	-
dc.date.issued	1963	-
dc.identifier.citation	Crystallography and Crystal Perfection (Book Chapetr). Ed. G N Ramachandran, 1963, p243	en
dc.identifier.uri	http://hdl.handle.net/2289/4985	-
dc.description	Restricted Access	en
dc.description.abstract	This paper nttempta to outline the routine procedures nwesary in tlle determination of the absolute configuration of a crystal by the Bijvoet method t+g momalous scatteringana employing photographic techniques. The method due to Peerdeman snd Bijvoet for assigning correct indices to the rdeetions recorded by the equi-inclination Weissonberg method has been restated to include trigonal. monoclinic and triclinic classess. The pairs of reflections named Bijvoet pairs whose intensities are to be compared for the determination of the absolute configuration have here been listed for all the enantiomorphous space groups. The Problem of the determination of the absolute configuration a crystal when only one crystallographic mounting is possible has been discussed. A simple double layor method of recording reflections of the type hkl and hkL has been evolved and its application to various crystal classess given.	en
dc.language.iso	en	en
dc.publisher	Academic Press	en
dc.rights	1963 Academic Press	en
dc.title	Some procedures in the determination of the absolute configuration of crystals	en
dc.type	Book chapter	en
Appears in Collections:	Miscellaneous Publications

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